Recent #Signal Integrity news in the semiconductor industry
➀ This article discusses a reference design for extending SPI communication range using LVDS interface, which improves signal quality, reduces EMI, and maintains robustness against noise.
➁ The design utilizes TI's TIDA-060017 reference design, featuring LVDS driver and receiver modules, to transmit SPI signals over longer distances.
➂ The solution offers advantages such as enhanced speed, lower power consumption, and compatibility with a variety of industrial and medical applications.
➀ Keysight Technologies has introduced two oscilloscopes designed for testing 1.6T optical transceivers: a single optical channel DCA-M and a dual optical channel DCA-M Sampling Oscilloscope. These instruments are engineered for high optical measurement sensitivity and integrated clock recovery.
➁ The oscilloscopes feature ultra-low optical channel noise and minimal intrinsic jitter, ensuring accurate high-data-rate analysis with jitter below 90 fs. They simplify test setup and compliance assurance while optimizing production efficiency.
➂ Keysight's advanced oscilloscopes support high-speed optical signal analysis and are expected to accelerate AI-driven data center innovations by providing precise measurements for 1.6T transceivers.
➀ Signal integrity and noise management become more critical at higher frequencies, complicating traditional testing methods.
➁ Advanced testing techniques like over-the-air (OTA) testing are being used to ensure precise fault detection.
➂ The need for high-speed serial interfaces like PCIe and SerDes is growing to test high-functional frequencies.
➃ Boutique design houses face challenges due to the cost and availability of advanced testing equipment.
➄ AI and machine learning are being explored for data analysis and predictive maintenance.
➅ Balancing cost and test accuracy remains a significant challenge.
➆ 6G technology promises unprecedented data transfer speeds, but also brings new technical challenges.
➇ Standards are crucial for ensuring compliance and interoperability in high-frequency testing.