➀ Bruker Corporation has announced the Dimension Nexus atomic force microscope (AFM); ➁ The system features the advanced NanoScope 6 controller and a compact design; ➂ It supports over 50 AFM modes and offers a balance of performance and value.

➀ The Vista 300 from Molecular Vista combines AFM and infrared spectroscopy to offer Photo-induced Force Microscopy (PiFM) with a spatial resolution of <5 nm, superior to methods like TOF-SIMS or XPS. ➁ PiFM can map and identify molecules, including organic or polymeric contaminants, inorganic particles, or EUV resist films. ➂ The instrument is designed for full 300 mm wafer analysis with a compact footprint and includes new automation features like AutoPiFM and AutoAlign for ease of use.

1. Park Systems introduces the Park FX200, an advanced AFM designed for 200 mm samples; 2. Features include lower noise floor, minimal thermal drift, and faster Z servo performance; 3. Offers automated operations, improved measurement accuracy, and comprehensive sample visualization.