<p>➀ Park Systems has expanded its FX Large Sample AFM lineup with the introduction of Park FX300 for 300mm wafer analysis; </p><p>➁ The Park FX300 is designed for high-precision analysis without the complexity of a fully automated inline system; </p><p>➂ The system is equipped with specialized features for long-range flatness measurements, precise sample alignment, and enhanced sample visualization.</p>