SFA has developed three different kinds of metrology and inspection (MI) machines and has supplied one of them to a major South Korean chipmaker.
The company has supplied a white light interferometry (WLI)-based height measurement machine to the conglomerate and plans to supply four additional units.
DI Corporation’s subsidiary, Digital Frontier, has supplied samples of its wafer inspection kit to SK Hynix for use in the production of HBM4. The equipment is currently undergoing quality testing by the chipmaker, and official orders are expected within three to six months.
Applied Materials demonstrated its new inspection kit SEMVision H20 on Thursday, equipped with the company's second-generation cold fusion emission (CFE) technology, which is three times faster than thermal fusion emission (TFE) equipment for analysis.
