<p>➀ Researchers from Helmholtz-Zentrum Berlin and Hebrew University developed a novel spectroscopic micro-ellipsometry (SME) technique to measure conductivity and optical responses of individual MXene flakes, revealing their intrinsic properties; </p><p>➁ The non-invasive, high-resolution method overcomes limitations of conventional approaches, providing nanoscale structural and electronic insights critical for optimizing MXene-based devices; </p><p>➂ The breakthrough advances applications in energy storage, flexible electronics, and clean energy technologies by enabling precise material characterization at the single-flake level.</p>