➀ The Fraunhofer IZM leads a project to develop new simulation models for microelectronics reliability testing; ➁ The project aims to reduce the time and cost of qualification tests through advanced simulation techniques; ➂ The models will be reusable and adaptable to more complex systems, enhancing reliability without compromising accuracy.
Related Articles
- High-Precision Panel-Level Packaging System4 months ago
- Contactless Timing for Paralympic Swimming4 months ago
- Fishing4 months ago
- Ed Tackles PIP4 months ago
- Reference Design For Gigabit Ethernet Front End4 months ago
- Petaflop-Scale AI Supercomputer4 months ago
- Watch Jensen Huang’s Nvidia GTC 2025 keynote here — Blackwell 300 AI GPUs expected4 months ago
- Reprogramming Liver Immunity: A Lipid Nanoparticle Approach for Pancreatic Cancer Therapy4 months ago
- Evolving Encyclopedia For Classifying Robots4 months ago
- Ed Eyes Up €1trn4 months ago