Recent #PSI news in the semiconductor industry

about 1 year ago
➀ Researchers at the Paul Scherrer Institut PSI, in collaboration with ETH Lausanne EPFL, ETH Zurich, and the University of Southern California, have set a new world record by achieving a 4 nanometer resolution in viewing a computer chip using X-ray technology. ➁ This high-resolution 3D imaging technique, known as ptychography, combines multiple images into a single high-resolution picture without the need for specialized lenses. ➂ The breakthrough could lead to advancements in information technology and biosciences, as the method is not limited to semiconductor inspection but can be applied to various fields.
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