<p>➀ Scientists used a 12-nanometer X-ray beam to non-destructively analyze ultra-thin nanosheets in electronics, revealing deformation mechanisms;</p><p>➁ The study identified two competing deformation mechanisms: long-range lattice mismatch and short-range layering effects near edges;</p><p>➂ These insights aid in optimizing nanostructures for next-gen microelectronics like GAAFETs, enhancing device performance prediction.</p>