<p>➀ Fraunhofer IPMS and DIVE developed an optical measurement system (DIVE VEpioneer®) to streamline quality control in semiconductor manufacturing, reducing control wafer usage by 25% and CO₂ emissions by 118,000 kg monthly;</p><p>➁ The system uses spectroscopy and AI for non-invasive wafer inspection, enabling faster defect detection and enhancing production efficiency;</p><p>➂ The collaboration, part of the Green ICT initiative, aims to advance sustainable semiconductor manufacturing, with further plans for automation and integration improvements.</p>