<p>➀ A joint team from the University of Stuttgart and the University of Melbourne developed a cost-effective method using an "optical sieve" to detect nanoplastics (0.2–1 µm) in environmental samples, requiring only a standard optical microscope; </p><p>➁ The technique utilizes semiconductor substrates etched with "Mie voids" that produce color changes when particles are trapped, enabling rapid size and quantity analysis without complex equipment; </p><p>➂ The method has potential applications in on-site environmental monitoring and health research, with plans to adapt it for irregular particles and real-world water samples.</p>
Related Articles
- Multimodal AI and AI TRiSM Reach Peak of Inflated Expectationsabout 11 hours ago
- CHIIPS #16 – Circularity insights from Global Electronics Associationabout 11 hours ago
- Global Semiconductor Sales Increase 20.6% Year-to-Year in Julyabout 14 hours ago
- 2Q25 Foundry Revenue Surges 14.6% to Record High, TSMC’s Market Share Hits 70%, Says TrendForceabout 14 hours ago
- Celebrating 65 years of Electronics Weeklyabout 15 hours ago
- Semiconductor technology for broadband satellite communications achieves record efficiencyabout 15 hours ago
- Semiconductor Technology for Broadband Satellite Communication Achieves Record Efficiencyabout 15 hours ago
- UZH Device Searches for Light Dark Matterabout 16 hours ago
- Milestone in Flexible Perovskite Solar Cells: EU-funded PEARL Consortium Demonstrates Roll-to-Roll Productionabout 17 hours ago
- Milestone in Flexible Perovskite Solar Cells: EU-Funded PEARL Consortium Demonstrates Roll-to-Roll Manufacturingabout 17 hours ago